X-Ray Fluorescence (XRF)

A recent addition to the Department of Earth and Planetary Science analytical instrumentation is a new Philips PW2400 wavelength dispersive x-ray fluorescence spectrometer with light element capability. This instrument has a high resolution WDS spectrometer and tandem detector system that allows a 10 fold improvement in detection limits over the older energy dispersive Spectrace XRF. The five crystals installed in the unit allow the analysis of elements O-U. The instrument also includes a fully automated 30-position sample changer for extended analysis acquisition time.

The Spectrace energy dispersive XRF is still operating and is used for the non-destructive analysis of large samples (50-150mm) such as stone and bronze artifacts. The Spectrace unit is equipped with both a Rh x-ray tube and an Americium 241 source which allows the measurement of K-lines as high as Samarium.